Photothermal Speckle Imaging

Light-based material identification and property analysis has been an integral part of lab-based and industrial evaluations, but traditional methods often come with limitations. The need for high-sensitivity methods, cost efficiency, and precision in assessing material properties necessitates the development of new technology. Traditional methods that rely on the detection of infrared light need cooled detectors that can be expensive and limit resolution. The high cost and other practical challenges associated with these methods create a problem. Additionally, the sensitivity of these traditional approaches often falls short of the requirements for accurately determining certain properties of complex materials.

Technology Description

The device includes a pump light source that irradiates a target specimen, generating a light pattern. A sensor observes this probe speckle pattern, harnessing light reflected from the specimen. A correlator then determines the material properties of the specimen by analyzing changes in images of this pattern on the basis of the level of irradiation. This device employs a unique and advanced approach that significantly enhances sensitivity when compared to previous methods. Unlike its counterparts, the device uses visible probe wavelengths, enabling the utilization of uncooled, low-cost visible detectors with significantly high spatial resolution. Instead of relying on the detection of infrared light to obtain target material properties, the device derives these properties from the visible light spectrum, making it unique and cost-effective.