Stationary Magic Angle Spinning Enhanced Solid-State Spin Sensor

Solid-state spin sensors are crucial in various fields, including quantum computing, data storage, and MRI, because of their ability to detect magnetic fields with high sensitivity. However, the existing methods to enhance the sensor's sensitivity have proved insufficient, pointing to a need for innovative improvements. Current methodologies face issues relating to the rapid dephasing time of color center defects, resulting from dipolar coupling between paramagnetic defects, which limits the overall sensor sensitivity. Dipolar interactions between these defects have been a longstanding impediment to achieving high sensitivity in these sensors and present a significant hurdle for the corresponding field's advancement.

Technology Description

Introduced is a solid-state spin sensor featuring enhanced sensitivity achieved by extending the T2* dephasing time of the color center defects. This approach minimizes the dipolar coupling among paramagnetic defects present within the sensor. The mitigation of dipolar coupling is realized by deploying a magic-angle-spinning magnetic field directed at the color center defects, generated through phase-shifted sinusoidal waveforms from a well-matched current source to the magnetic field generator, such as Helmholtz coils. The differentiating factor of this technology lies in its application of a magic-angle-spinning magnetic field on color center defects to reduce their dephasing, thus enhancing the sensor's sensitivity. The field frequency, contingent on the precession period of the color center defects, further improves measurement sensitivity by reducing the dephasing of these defects. This advancement offers a substantial improvement compared to existing solid-state spin sensors, marking a significant breakthrough in the field.